PGT manufactures both Si(Li) and HPGe detectors for X-ray analysis. Si(Li) detectors with the standard beryllium window have a useful energy range of 1-60 keV,
while HPGe detectors are suitable up to 100 keV.
Optional light-element capability extends the lower limit to below 185 eV. Both HPGe and Si(Li) detectors are fully temperature-cyclable and may be stored indefinitely at room temperature with no degradation in resolution. The X-ray source can range from nuclear accelerators to secondary X rays generated by fluorescence. X-ray detectors are used extensively for research, quality control, and failure analysis.